Extensions of self-assembled structures to increased dimensions via a “bootstrap” self-templating method

ABSTRACT

Methods for fabricating sublithographic, nanoscale arrays of openings and linear microchannels utilizing self-assembling block copolymers, and films and devices formed from these methods are provided. Embodiments of the invention use a self-templating or multilayer approach to induce ordering of a self-assembling block copolymer film to an underlying base film to produce a multilayered film having an ordered array of nanostructures that can be removed to provide openings in the film which, in some embodiments, can be used as a template or mask to etch openings in an underlying material layer.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a division of U.S. patent application Ser. No. 11/738,169, filed Apr. 20, 2007, now U.S. Pat. No. 8,372,295, issued Feb. 12, 2013, the disclosure of which is hereby incorporated herein by this reference.

TECHNICAL FIELD

Embodiments of the invention relate to methods of fabricating nanoscale arrays of micro-vias, microchannels and microstructures by use of thin films of self-assembling block copolymers, and devices resulting from those methods.

BACKGROUND OF THE INVENTION

As the development of nanoscale mechanical, electrical, chemical and biological devices and systems increases, new processes and materials are needed to fabricate nanoscale devices and components. Conventional optical lithographic processing methods are not able to accommodate fabrication of structures and features much below the 100 nm level. The use of self-assembling diblock copolymers presents another route to patterning at nanometer dimensions. Diblock copolymer films spontaneously assembly into periodic structures by microphase separation of the constituent polymer blocks after annealing, for example, by thermal annealing above the glass transition temperature of the polymer or by solvent annealing, forming ordered domains at nanometer-scale dimensions. Following self-assembly, one block of the copolymer can be selectively removed and the remaining patterned film used as an etch mask for patterning nanosized features into the underlying substrate. Since the domain sizes and periods (L_(o)) involved in this method are determined by the chain length of a block copolymer (MW), resolution can exceed other techniques such as conventional photolithography, while the cost of the technique is far less than electron beam lithography or EUV photolithography, which have comparable resolution.

The film morphology, including the size and shape of the microphase-separated domains, can be controlled by the molecular weight and volume fraction of the AB blocks of a diblock copolymer to produce lamellar, cylindrical, or spherical morphologies, among others. For example, for volume fractions at ratios greater than about 80:20 of the two blocks (AB) of a diblock polymer, a block copolymer film will microphase separate and self-assemble into a periodic spherical domains with spheres of polymer B surrounded by a matrix of polymer A. For ratios of the two blocks between about 60:40 and 80:20, the diblock copolymer assembles into a periodic hexagonal close-packed or honeycomb array of cylinders of polymer B within a matrix of polymer A. For ratios between about 50:50 and 60:40, lamellar domains or alternating stripes of the blocks are formed. Domain size typically ranges from 5-50 nm.

Diblock copolymer thin films of cylindrical and lamellar phases may both form striped phases relative to an interface. For cylindrical phase films, a striped pattern results from parallel cylinder orientation, while for lamellar phase films, a striped pattern results from perpendicular domain orientation. From a top down view, perpendicular-oriented lamellae and parallel-oriented cylinders appear similar, e.g., as parallel lines.

Graphoepitaxy techniques using defined topography such as trench edges have been used in an attempt to orient and order copolymer domains and control registration and alignment of the self-assembled blocks to form a desired pattern.

While the self-assembly of diblock copolymers of tightly controlled composition and polydispersity has been demonstrated as a method of preparing a variety of nanoscale, sub-lithographic structures, the necessity of casting only very thin films limits the dimensions of the structures, particularly in the z-axis direction (i.e., perpendicular to the substrate surface). Openings produced by selective etching and removal of polymer domains of the films may not achieve the required aspect ratio for critical dimensions of desired features.

It would be useful to provide a method of fabricating films of arrays of ordered nanostructures that overcome these problems.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the invention are described below with reference to the following accompanying drawings, which are for illustrative purposes only. Throughout the following views, the reference numerals will be used in the drawings, and the same reference numerals will be used throughout the several views and in the description to indicate same or like parts.

FIG. 1 illustrates a diagrammatic top plan view of a portion of a substrate at a preliminary processing stage according to an embodiment of the present disclosure, showing the substrate with a trench. FIGS. 1A and 1B are elevational, cross-sectional views of embodiments of the substrate depicted in FIG. 1 taken along line 1A/1B-1A/1B.

FIGS. 2-5 illustrate diagrammatic top plan views of the substrate of FIG. 1 at various stages of the fabrication of a self-assembled block copolymer film according to an embodiment of the present disclosure. FIGS. 2A-5A illustrate elevational, cross-sectional views of embodiments of a portion of the substrate depicted in FIGS. 2-5 taken, respectively, along line 2A-2A to line 5A-5A.

FIGS. 6 and 7 illustrate elevational, cross-sectional views of the substrate depicted in FIG. 5A, in subsequent stages.

FIG. 8 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 7 at a subsequent stage. FIG. 8A is an elevational, cross-sectional view of the substrate depicted in FIG. 8 taken along line 8A-8A. FIG. 8B is a view of FIG. 8A in a subsequent processing step.

FIG. 9 illustrates a diagrammatic top plan view of a portion of a substrate at a preliminary processing stage according to another embodiment of the present disclosure, showing the substrate with a trench. FIG. 9A is an elevational, cross-sectional view of the substrate depicted in FIG. 9 taken along line 9A-9A.

FIGS. 10-13 illustrate diagrammatic top plan views of the substrate of FIG. 9 at various stages of the fabrication of a self-assembled block copolymer film according to an embodiment of the present disclosure utilizing a cylindrical-phase block copolymer for the base film. FIGS. 10A-13A illustrate elevational, cross-sectional views of embodiments of a portion of the substrate depicted in FIGS. 10-13 taken, respectively, along line 10A-10A to line 13A-13A.

FIGS. 14-17 illustrate elevational, cross-sectional views of the substrate depicted in FIG. 13A, in subsequent stages.

FIG. 17 illustrates an intermediate structure showing the removal of half-cylindrical domains of the base layer.

FIG. 18 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 17 at a subsequent stage. FIG. 18A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 18 taken along line 18A-18A. FIG. 18B is a view of FIG. 18A in a subsequent processing step.

FIGS. 19-21 illustrate diagrammatic top plan views of the substrate of FIG. 1 at various stages of the fabrication of a self-assembled block copolymer film according to another embodiment of the present disclosure utilizing a cylindrical-phase block copolymer for the base film. FIGS. 19A-21A illustrate elevational, cross-sectional views of embodiments of a portion of the substrate depicted in FIGS. 19-21 taken, respectively, along line 19A-19A to line 21A-21A.

FIGS. 22 and 23 illustrate elevational, cross-sectional views of the substrate depicted in FIG. 21A, in subsequent stages.

FIG. 24 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 23 showing the removal of cylindrical domains at a subsequent stage according to an embodiment of the invention. FIG. 24A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 24 taken along line 24A-24A. FIG. 24B is a view of FIG. 24A in a subsequent processing step.

FIG. 25 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 24 showing the removal of the matrix domain at a subsequent stage according to another embodiment of the invention. FIG. 25A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 25 taken along line 25A-25A. FIG. 25B is a view of FIG. 25A in a subsequent processing step.

FIG. 26 illustrates a diagrammatic top plan view of the substrate of FIG. 1 at a subsequent stage of the fabrication of a self-assembled block copolymer film according to another embodiment of the present disclosure utilizing a cylindrical-phase block copolymer for the base film. FIG. 26A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 26 taken along line 26A-26A.

FIGS. 27-30 illustrate elevational, cross-sectional views of the substrate depicted in FIG. 26A, in subsequent stages.

FIG. 31 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 30 showing the removal of cylindrical domains at a subsequent stage according to an embodiment of the invention. FIG. 31A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 31 taken along line 31A-31A. FIG. 31B is a view of FIG. 31A in a subsequent processing step.

FIG. 32 illustrates a diagrammatic top plan view of a portion of the substrate of FIG. 30 showing the removal of the matrix domain at a subsequent stage according to another embodiment of the invention. FIG. 32A illustrates an elevational, cross-sectional view of the substrate depicted in FIG. 32 taken along line 32A-32A. FIG. 32B is a view of FIG. 32A in a subsequent processing step.

DETAILED DESCRIPTION OF THE INVENTION

The following description with reference to the drawings provides illustrative examples of devices and methods according to embodiments of the invention. Such description is for illustrative purposes only and not for purposes of limiting the same.

In the context of the current application, the terms “semiconductor substrate” or “semiconductive substrate” or “semiconductive wafer fragment” or “wafer fragment” or “wafer” will be understood to mean any construction comprising semiconductor material, including but not limited to bulk semiconductive materials such as a semiconductor wafer (either alone or in assemblies comprising other materials thereon), and semiconductive material layers (either alone or in assemblies comprising other materials). The term “substrate” refers to any supporting structure including, but not limited to, the semiconductive substrates, wafer fragments or wafers described above.

“L_(o)” is the inherent pitch (bulk period or repeat unit) of structures that self-assemble upon annealing from a self-assembling (SA) block copolymer or a blend of a block copolymer with one or more of its constituent homopolymers.

Processing conditions of embodiments of the invention use a graphoepitaxy technique utilizing the sidewalls of trenches as constraints to induce orientation and registration of a first film of a self-assembling diblock copolymer to form an ordered array pattern registered to the trench sidewalls. The first polymer film is then used as a template or base layer for inducing the ordering of a subsequently deposited block copolymer film such that, upon annealing, the polymer domains orient and are registered to the underlying structures, resulting in a stacked double- or multi-layered structure with like polymer domains registered to each other. The procedure can be repeated as needed to achieve a desired structure pattern of a required dimension in the z-axis direction. In some embodiments, the desired patterned can be selectively etched by methods known in the art, and the resulting template structures can be used to prepare features within a substrate.

Steps in a method for fabricating thin films from self-assembling (SA) block copolymers that define nanometer-scale linear array patterns according to embodiments of the invention are illustrated in FIGS. 1-8.

The method forms a multi-layer pattern within trenches by forming a polymer base film or template with ordered structures within the trenches for inducing the ordering of an overlying lamellar phase block copolymer film such that the lamellar domains are oriented perpendicularly and registered to the underlying assembled domains of the base film.

The base layer within the trenches can be formed from a lamellar-phase block copolymer film, which upon annealing forms a registered lamellar array of alternating polymer-rich blocks that extend the length and are oriented parallel to the sidewalls and perpendicular to the floor of the trenches. In other embodiments, the base layer is &lined from a cylindrical-phase block copolymer material which, upon annealing, forms lines of half-cylinders in a polymer matrix extending the length and oriented parallel to the sidewalls and floor of the trenches. The assembled base film can then be used as a template for inducing the ordering of an overlying lamellar-phase block copolymer film such that the lamellar domains of the annealed film are oriented perpendicularly and registered to the underlying pattern of the base film within the trenches.

To produce a base polymer film within the trenches using a lamellar-phase block copolymer, the surface of the sidewalls and edges of the trenches are preferential wetting by one block of the copolymer and the trench floors are neutral wetting (equal affinity for both blocks of the copolymer) to allow both blocks of the copolymer material to wet the floor of the trench. Entropic forces drive the wetting of a neutral wetting surface by both blocks, resulting in the formation of a layer of perpendicular lamellae across the width of each trench.

In an embodiment shown in FIGS. 1 and 1A, a substrate 10 is provided bearing a neutral wetting surface. The substrate 10 can comprise, for example, silicon (with native oxide), oxide (e.g., silicon oxide, SiO_(x)) or an inorganic film. In the illustrated embodiment, a neutral wetting layer 12 is formed on the substrate 10 prior to forming an overlying material layer 14 (e.g., oxide). Etching through the material layer 14 to form a trench 16 exposes the underlying neutral wetting layer 12 as a floor or bottom surface 18 of the trench 16. Adjacent trenches are separated by a spacer or crest 20. The trench 16 is structured with opposing sidewalls 22, opposing ends 24, a width (w_(t)), a length (l_(t)) and a depth (D_(t)).

A neutral wetting surface can be provided, for example, by applying a neutral wetting polymer to form layer 12 on the surface of the substrate 10. In the use of a self-assembling (SA) diblock copolymer composed of PS-b-PMMA, a random PS:PMMA copolymer brush layer (PS-r-PMMA)), which exhibits non-preferential or neutral wetting toward PS and PMMA can be applied by spin-coating onto the surface of substrate 10. The brush can be affixed by grafting (on an oxide substrate) or by cross-linking (any surface) using UV radiation or thermal processing. For example, a random copolymer solution composed of PS and PMMA with hydroxyl group(s) (e.g., about 58% PS) can be applied to the surface of the substrate 10 as a layer about 5-10 nm thick and grafted by heating at about 160° C. for about 48 hours.

In another embodiment, a surface that is neutral wetting to PS-b-PMMA can be prepared by spin coating a blanket layer of a photo- or thermally cross-linkable random copolymer such as a benzocyclobutene- or azidomethylstyrene-functionalized random copolymer of styrene and methyl methacrylate (e.g., poly(styrene-r-benzocyclobutene-r-methyl methacrylate (PS-r-PMMA-r-BCB) onto the surface of the substrate 10 prior to forming the material layer 14. For example, such a random copolymer can comprise about 42% PMMA, about (58−x)% PS and x % (e.g., about 2-3%) of either polybenzocyclobutene or poly(para-azidomethylstyrene)). An azidomethylstyrene-functionalized random copolymer can be UV crosslinked (e.g., 1-5 MW/cm² exposure for about 15 seconds to about 30 minutes) or thermally crosslinked (e.g., at about 170° C. for about 4 hours). A benzocyclobutene-functionalized random copolymer can be thermally cross-linked (e.g., at about 200° C. for about 4 hours or at about 250° C. for about 10 minutes).

Another neutral wetting surface for PS-b-PMMA can be provided by hydrogen-terminated silicon, which can be prepared by a conventional process, for example, by a fluoride ion etch of a silicon substrate 10 (with native oxide present, about 12-15 Å) for example, by immersion in aqueous solution of hydrogen fluoride (HF) and buffered HF or ammonium fluoride (NH₄F), by HF vapor treatment, by exposure to hot H₂ vapor, or by a hydrogen plasma treatment (e.g., atomic hydrogen).

Referring now to FIG. 1B in another embodiment, the material layer 14 can be formed on the substrate 10 and etched to form the trench 16, and the neutral wetting material 12 then applied to the trench floor 18. For example, trench floors that are neutral wetting to PS-b-PMMA can be prepared by spin coating PS-r-PMMA-r-BCB onto the surface of the substrate 10 within the trenches and thermally crosslinking the polymer (e.g., 190° C., 4 hours) to form a crosslinked polymer mat as a neutral wetting layer 12. Capillary forces pull the random copolymer to the bottom of deep trenches. Non-crosslinked polymer material can be subsequently removed. A neutral-wetting polymer (NWP) such as random copolymer of P(S-r-MMA-r-HEMA) can also be grafted selectively to a material layer, e.g., an oxide floor. See, for example, In et al., Langmuir, 2006, 22, 7855-7860, the disclosure of which is incorporated by reference herein. In other embodiments, an olefinic monomer such as PMMA or PS can be grafted onto an H-terminated silicon substrate 10 (i.e., floor 18) by an in situ free radical polymerization using a di-olefinic linker such divinyl benzene to produce an about 10-15 nm thick film.

Trench sidewalls 22 and ends 24 are preferential wetting by one block of the copolymer to induce formation of lamellae as the blocks self-assemble. The material layer 14 defining the trench surfaces can be an inherently preferential wetting material, or in other embodiments, a layer of a preferential wetting material can be applied onto the surfaces of the trenches.

For example, in the use of poly(styrene-block-methyl methacrylate) (PS-b-PMMA), an oxide (e.g., silicon oxide, SiO_(x)) or a clean silicon surface (with native silicon oxide) exhibits preferential wetting toward the PMMA block to result in the assembly of a thin (e.g., ¼ pitch) interface layer of PMMA and alternating PMMA and PS lamellae (e.g., ½ pitch) within each trench in the use of a lamellar-phase block copolymer material. Other preferential wetting surfaces to PMMA can be provided, for example, by silicon nitride, silicon oxycarbide, polymethylmethacrylate (PMMA) polymer grafted to a sidewall material such as silicon oxide, and resist materials such as methacrylate-based resists. For example, a PMMA that is modified with a moiety containing one or more hydroxyl (—OH) groups (e.g., hydroxyethylmethacrylate) can be applied by spin coating and then heated (e.g., to about 170° C.) to allow the OH groups to end-graft to the oxide sidewalls 22 and ends 24 of the trenches. Non-grafted material can be removed from the neutral wetting layer 12 by rinsing with an appropriate solvent (e.g., toluene). See, for example, Mansky et al., Science, 1997, 275, 1458-1460, and In et al., Langmuir, 2006, 22, 7855-7860, the disclosures of which are incorporated by reference herein.

The trench sidewalls 22, edges and floors 18 influence the structuring of the array of nanostructures within the trenches 16. The boundary conditions of the trench sidewalls 22 in both the x- and y-axis impose a structure wherein each trench 16 contains n number of features (i.e., lamellae, cylinders, etc.). Factors in forming a single array or layer of nanostructures within the trenches 16 include the width and depth of the trench 16, the formulation of the block copolymer to achieve the desired pitch (L_(o)), and the thickness (t) of the copolymer film.

The trenches 16 are constructed with a width (w_(t)) such that a block copolymer (or blend) will self-assemble upon annealing into a single layer of “n” structures spanning the width (w_(t)) of the trench 16, with each structure (i.e., lamellae, cylinders, etc.) being separated by a value of L_(o) (from center-to-center). The width (w_(t)) of the trenches 16 is a multiple of the inherent pitch value (L_(o)) of the polymer being equal to or about nL_(o) (“n*L_(o)”), typically ranging from about n*10 to about n*100 nm (with n being the number of features or structures). The depth (D_(t)) of the trenches 16 is a multiple of the L_(o) value of the block copolymer used for the base layer. The application and annealing of a block copolymer material having an inherent pitch value of L_(o) in a trench having a width (w_(t)) at or about L_(o) will result in the formation of a single layer of “n” structures spanning the width and registered to the sidewalls for the length of the trench. In some embodiments, the trench 16 dimension is about 50-500 nm wide (w_(t)) and about 1,000-10,000 μm in length (l), with a depth (D_(t)) of about 20-200 nm.

The trenches 16 can be formed using a lithographic tool having an exposure system capable of patterning at the scale of L_(o) (10-100 nm). Such exposure systems include, for example, extreme ultraviolet (EUV) lithography, proximity X-rays, and electron beam (e-beam) lithography, as known and used in the art. Conventional photolithography can attain (at smallest) about 58 nm features.

Referring now to FIGS. 2 and 2A, a layer 26 of a self-assembling (SA) lamellar-phase diblock copolymer material having an inherent pitch at or about L_(o) (or a ternary blend of block copolymer and homopolymers blended to have a pitch at or about L_(o)) is then deposited, typically by spin casting (spin-coating) onto the floor 18 of the trench 16. The block copolymer material can be deposited onto the patterned surface by spin casting from a dilute solution (e.g., about 0.25-2 wt % solution) of the copolymer in an organic solvent such as dichloroethane (CH₂Cl₂) or toluene, for example.

The thickness (t_(t)) of the diblock copolymer layer 26 is less than the trench depth (D_(t)) and at or about the L_(o) value of the copolymer material such that the diblock copolymer layer 26 will self-assemble upon annealing to form a single layer of lamellae across the width (w_(t)) of the trench. A typical thickness (t_(t)) of the diblock copolymer layer 26 is about 20% of the L_(o) value of the copolymer (e.g., about 10-100 nm) to form alternating polymer-rich lamellar blocks having a width of about L_(o) (e.g., 25-35 nm) in a matrix of another block within each trench. The thickness of the diblock copolymer layer 26 can be measured, for example, by ellipsometry techniques. As shown, a thin diblock copolymer layer 26 of the copolymer material can be deposited onto the spacers 20 of the material layer 14; this film layer will not self-assemble, as it is not thick enough to form structures.

Although diblock copolymers are used in the illustrative embodiments of this disclosure, other types of block copolymers (i.e., triblock or multiblock copolymers) can be used. Examples of diblock copolymers include poly(styrene-block-methyl methacrylate) (PS-b-PMMA), polyethyleneoxide-polyisoprene, polyethyleneoxide-polybutadiene, polyethyleleoxide-polystyrene, polyetheleneoxide-polymethylmethacrylate, polystyrene-polyvinylpyridine, polystyrene-polyisoprene (PS-b-PI), polystyrene-polybutadiene, polybutadiene-polyvinylpyridine, and polyisoprene-polymethylmethacrylate, among others. Examples of triblock copolymers include poly(styrene-block methyl methacrylate-block-ethylene oxide). One of the polymer blocks of the block copolymer should be selectively and readily removable in order to fabricate an etch mask or template from the annealed film.

In embodiments in which the base or template layer is formed from a lamellar-forming diblock copolymer, the volume fractions of the two blocks (AB) are generally at a ratio between about 50:50 and 60:40. To achieve an annealed base film in which the lamellae are surface exposed, the Chi value of the polymer blocks (e.g., PS and PMMA) at common annealing temperatures is generally small such that the air interface is equally or non-selectively wetting to both blocks. An example of a lamellae-forming symmetric diblock copolymer is PS-b-PMMA with a weight ratio of about 50:50 (PS:PMMA) and total molecular weight (M_(n)) of about 51 kg/mol.

In embodiments of the invention, the block copolymer material can also be formulated as a binary or ternary blend comprising a SA block copolymer and one or more homopolymers of the same type of polymers as the polymer blocks in the block copolymer, to produce blends that swell the size of the polymer domains and increase the L_(o) value of the polymer. The volume fraction of the homopolymers can range from 0 to about 40%. An example of a ternary diblock copolymer blend is a PS-b-PMMA/PS/PMMA blend, for example, 46K/21K PS-b-PMMA containing 40% 20K polystyrene and 20K poly(methylmethacrylate). The L_(o) value of the polymer can also be modified by adjusting the molecular weight of the block copolymer, e.g., for lamellae, L_(o)˜(MW)^(2/3).

Optionally, ellipticity (“bulging”) can be induced in the structures by creating a slight mismatch between the trench and the spacer widths and the inherent pitch (L_(o)) of the block copolymer or ternary blend, as described, for example, by Cheng et al., “Self-assembled One-Dimensional Nanostructure Arrays,” Nano Lett., 2006, 6(9), 2099-2103, the disclosure of which are incorporated by reference herein, which then reduces the stresses that result from such mismatches.

Referring now to FIGS. 3 and 3A, the first diblock copolymer layer 26 is then annealed, for example, by thermal annealing to above the glass transition temperature of the component blocks of the copolymer material to cause the polymer blocks to phase separate and self-assemble according to the preferential and neutral wetting of the trench surfaces 18, 22, 24 to form a self-assembled polymer structure 28. For example, a PS-b-PMMA copolymer film can be annealed at a temperature of about 180-285° C. in a vacuum oven for about 1-120 hours to achieve the self-assembled morphology. The film can also be solvent annealed, for example, by slowly swelling both blocks of the film with a solvent, then slowly evaporating the solvent.

The constraints provided by the width (w_(t)) of the trenches and the character of the copolymer composition combined with preferential or neutral wetting surfaces within the trenches results, upon annealing, in a single layer of n elements (lamellae) across the width (w_(t)) of the trench. The number “n” or pitches of elements (e.g., lamellar blocks) or half-cylinders within a trench is according to the width (w_(t)) of the trench and the molecular weight (MW) of the block copolymer. As shown in FIG. 3A, a lamellar-phase block copolymer material used to form the base layer 28 will, upon annealing, self-assemble into perpendicular-oriented, alternating polymer-rich blocks 30, 32 spanning the width (w_(t)) of the trench 16 at an average pitch value at or about L_(o). For example, depositing and annealing an about 50:50 PS:PMMA block copolymer film (M_(n)=51 kg/mol; L_(o)=32 nm) in an about 250 nm wide trench will subdivide the trench into about eight (8) lamellar structures.

The resulting morphologies of the annealed base film 28 (i.e., perpendicular orientation of lamellae) can be examined, for example, using atomic force microscopy (AFM), transmission electron microscopy (TEM), scanning electron microscopy (SEM).

The annealed and ordered base film 28 is then treated to crosslink the polymer segments to fix and enhance the strength of the self-assembled polymer blocks 30, 32 within the trench 16 (e.g., to crosslink the PS segments). The polymers can be structured to inherently crosslink (e.g., upon exposure to ultraviolet (UV) radiation, including deep ultraviolet (DUV) radiation), or one or both of the polymer blocks 30, 32 of the copolymer material can be formulated to contain a crosslinking agent. The material of diblock copolymer layer 26 outside the trench (e.g., on spacer 20) can then be removed.

For example, in one embodiment, the trench regions can be selectively exposed through a reticle to crosslink only the self-assembled film 28 within the trench 16, and a wash can then be applied with an appropriate solvent (e.g., toluene), to remove the non-crosslinked portions of the film 28 (e.g., material of the diblock copolymer layer 26 on the spacer 20) leaving the registered self-assembled base film within the trench 16 and exposing the surface of material layer 14 above/outside the trench 16 (e.g., the spacer 20). In another embodiment, the annealed film 28 can be crosslinked globally, a photoresist layer can be applied to pattern and expose the areas of the film outside the trench regions (e.g., over the spacers 20), and the exposed portions of the film can be removed, for example by an oxygen (O₂) plasma treatment. In other embodiments, the spacers 20 are narrow in width, for example, a width (w_(s)) of one of the copolymer domains (e.g., about L_(o)) such that the material of diblock copolymer layer 26 on the spacers is minimal and no removal is required.

Referring now to FIGS. 4 and 4A, a layer 34 a of a lamellar-phase block copolymer material having an inherent pitch at or about L_(o) (or a ternary blend of block copolymer and homopolymers blended to have a pitch at or about L_(o)) is then deposited (e.g., by spin casting) onto the annealed and crosslinked base film 28 within the trench. The block copolymer material can be spin cast, for example, from a dilute solution of the copolymer in an organic solvent (e.g., about 0.25-2 wt % solution).

The lamellar-phase block copolymer layer 34 a is cast onto the base film 28 within the trench 16 to a thickness (t₂) at or about the L_(o) value of the block copolymer material such that, upon annealing, the lamellar-phase block copolymer layer 34 a will self-assemble to form a single layer of perpendicular-oriented lamellar domains, each having a width (w₂) at or about 0.5 L_(o).

As shown in FIGS. 5 and 5A, annealing of the lamellar-phase block copolymer layer 34 a is then conducted to cause the polymer blocks to separate and self-assemble into a film 36 a composed of perpendicular-oriented lamellar-phase domains 38 a, 40 a in a striped pattern, which are ordered and registered, respectively, to the polymer domains 30, 32 of the base layer 28. Annealing can be conducted, for example, over a range of about 110-290° C. for a PS-b-PMMA copolymer film. The annealed film 36 a is then crosslinked, and the non-ordered copolymer material 34 a on the material layer 14 outside the trench 16 can be removed (e.g., by solvent wash, O₂ plasma treatment) resulting in the structure shown in FIG. 5A.

Referring now to FIG. 6, a second layer 34 b of the lamellar-phase block copolymer material can be deposited to a thickness (t₂) at or about L_(o) onto the annealed and crosslinked film 36 a. The second lamellar-phase block copolymer layer 34 b can then be annealed such that the polymer blocks self-assemble into a film 36 b of perpendicular-oriented lamellar-phase domains 38 b, 40 b oriented and registered to the underlying polymer blocks 38 a, 40 a, whereupon the film 36 b can be a crosslinked and non-ordered copolymer material of second lamellar-phase block copolymer layer 34 b outside the trench 16 can be removed, as illustrated in FIG. 7. This process can be repeated as desired to deposit and form additional layers of the lamellar-phase block copolymer to result in a film structure 42 of a desired thickness (T). In embodiments of the invention, the aspect ratio of the openings formed in the multilayered film is at least about two times the aspect ratio that can be provided by similar single layer films, and can be increased with the addition of film layers, generally at least about 1:2 and ranging from about 1:2 to about 1:20.

Referring now to FIGS. 8 and 8A, one of the block components can be selectively removed to produce a thin film 44 that can be used, for example, as a lithographic template or mask to pattern the underlying substrate 10 in a semiconductor processing to define regular patterns in the nanometer size range (i.e., about 10-100 nm). Within the trench 16, selective removal of one of the polymer blocks of each of the layers 36 a, 36 b and the base film 28 is performed.

For example, as illustrated in FIG. 8A, selective removal of one of the polymer domains 30, 38 a-b (e.g., PMMA) will result in openings (slits) 46 separated by vertically oriented walls 48 composed of polymer domains 32, 40 a-b (e.g., PS), and the trench floor 18 (e.g., neutral wetting layer 12) exposed. Removal of PMMA phase domains can be performed, for example, by application of an oxygen (O₂) or CF₄ plasma.

In embodiments in which the PS phase domains are removed, the openings (slits) are separated by walls composed of the PMMA domains.

In some embodiments, the resulting film 44 has a corrugated surface that defines a linear pattern of fine, nanometer-scale, parallel slits (openings) 46 about 5-50 nm wide and several microns in length (e.g., about 10-4000 μm), the individual slits separated by walls 48 about 5-50 nm wide, providing an aspect ratio ranging from about 1:2 to about 1:20. For example, removal of the PMMA domains affords a PS mask of sublithographic dimensions, for example, a pitch of about 35 nm (17.5 nm PS domain). A smaller pitch can be dialed in by using lower molecular weight diblock copolymers.

The films can be used, for example, as a lithographic template or etch mask to pattern (arrows ↓↓) the underlying substrate 10, for example, by a non-selective RIE etching process, to delineate a series of channels or grooves 50, shown in phantom in FIG. 8A, and extending to an active area or element 51 a. In some embodiments, the channels 50 can then be filled with a material 51 b as illustrated in FIG. 8B, for example, a conductive material (e.g., metal) to form nanowire channel arrays for transistor channels, semiconductor capacitors, and other structures, or with a dielectric material to separate active areas (e.g., substrate 10). Further processing can then be performed as desired.

The films provide linear arrays having long range ordering and registration for a wide field of coverage for templating a substrate. The films are useful as etch masks for producing close pitched nanoscale channel and grooves that are several microns in length, for producing features such as floating gates for NAND flash with nanoscale dimensions. By comparison, photolithography techniques are unable to produce channels much below 60 nm wide without high expense. Resolution can exceed other techniques such as conventional photolithography, while fabrication costs utilizing methods of the disclosure are far less than electron beam (E-beam) or EUV photolithographies which have comparable resolution.

A method according to another embodiment of the invention for forming a thin film that defines a linear array pattern utilizing a base layer formed from a cylindrical-phase block copolymer is illustrated with reference to FIGS. 9-18. The base layer, upon annealing, forms lines of half-cylinders in a polymer matrix extending the length and oriented parallel to the sidewalls and floor of the trenches. The assembled base film can then be used as a template for inducing the ordering of an overlying lamellar-phase block copolymer film such that the lamellar domains of the annealed film are oriented perpendicularly and registered to the underlying pattern of the half-cylinders of the base film.

Referring to FIGS. 9 and 9A, in embodiments using a cylindrical-phase block copolymer to form the base polymer film 26′ within the trench 16′, the surfaces of the floor 18′, sidewalls 22′ and ends 24′ of the trench are preferential wetting by the minority block of the copolymer to induce formation of parallel lines of half-cylinders of the minority block wetting the air interface (surface exposed) down the middle of each trench aligned parallel to the trench sidewalls and floor. For example, substrate 10′ can be composed of an inherently preferential wetting material such as a clean silicon surface (with native silicon oxide) and material layer 14′ can be composed of oxide (e.g., SiO_(x)). Both materials exhibit preferential wetting toward the PMMA block to result in the assembly of a thin interface layer of PMMA on the trench sidewalls as well as PMMA cylinders in the center of a PS matrix within each trench. Other preferential wetting surfaces to PMMA can be provided, for example, by silicon nitride, silicon oxycarbide, and PMMA polymer grafted to a sidewall material such as silicon oxide, and resist materials such as such as methacrylate-based resists. See, for example, C. T. Black and O. Bezencenet, “Nanometer-Scale Pattern Registration and Alignment by Directed Diblock Copolymer Self-Assembly,” IEEE Transactions on Nanotechnology, 2004, 3(3), 412-415; C. T. Black, “Self-Aligned self-assembly of multi-nanowire silicon field effect transistors,” Applied Physics Letters, 2005, 87, 163116; R. Ruiz, R. L. Sandstrom and C. T. Black, “Induced Orientational Order in Symmetric Diblock Copolymer Thin-Films,” Advanced Materials, 2007, 19(4), 587-591, the disclosures of which are incorporated by reference herein.

In using a cylindrical-phase block copolymer, the depth (D_(t)) of the trench 16′ is less than L_(o) In some embodiments, the trench dimension is about 50-2000 nm wide (w₁) with a depth (D_(t)) of about 15-25 nm. As shown in FIGS. 10 and 10A, a layer 26′ of the cylinder-forming block copolymer material (inherent pitch at or about L_(o)) is deposited onto the floor 18′ of the trench 16′ to a thickness (t₁) greater than the trench depth (D_(t)) but less than about the L_(o) value of the block copolymer material such that the copolymer cylindrical-phase block layer 26′ will self-assemble upon annealing to form a single layer of parallel-oriented half-cylinders of one block having a diameter of about L_(o) in a matrix of another block as parallel lines across the width (w_(t)) of the trench. The number “n” or pitches of half-cylinders within a trench is according to the width (w_(t)) of the trench (e.g., about nL_(o)) and the molecular weight (MW) of the block copolymer.

The cylindrical-phase block copolymer can be a diblock or multiblock copolymer, and the copolymer material can be formulated as a binary or ternary blend comprising a homopolymer(s), as previously described. In embodiments in which the base layer is formed using a cylindrical-phase diblock copolymer, the volume fractions of the two blocks (AB) are generally at a ratio between about 60:40 and 80:20. An example of a cylindrical phase diblock copolymer material is PS-b-PMMA (L_(o)=35 nm) composed of about 70% PS and 30% PMMA (weight ratio of 70:30) with a total molecular weight (M_(n)) of 67 kg/mol to form about 20 nm diameter half-cylinder PMMA domains in a matrix of PS. To achieve an annealed base film in which the half-cylinders are surface exposed, the Chi value of the polymer blocks (e.g., PS and PMMA) at common annealing temperatures and the difference between interfacial energies of each block and the air is generally small, such that the air interface is equally or non-selectively wetting to both blocks.

Referring now to FIGS. 11 and 11A, the cylindrical-phase block copolymer film 26′ is annealed to form the base layer 28′, resulting in parallel-oriented half-cylinders 30′ within a polymer matrix 32′ spanning the width (w_(t)) of the trench 16′, with each cylinder being separated by an average value of at or about L_(o), and an interface layer 30 a′ along the sidewalls 22′ and floor 18′. For example, depositing and annealing a 70/30 PS:PMMA block copolymer film (M_(n)=67 kg/mol; L_(o)=35 nm) in an about 250 nm wide trench will subdivide the trench into about seven (7) half-cylinder structures. As shown, a thin cylindrical-phase block copolymer film 26′ of the copolymer material deposited on the spacers or crests 20′ of the material 14′ between trenches is not thick enough to self-assemble. In some embodiments, the spacers 20′ between the trenches are narrow, for example, having a width (w_(s)) of one of the copolymer domains such that the material of cylindrical-phase block copolymer film 26′ on the spacers 20′ is essentially nonexistent.

The annealed base film 28′ is then be treated to crosslink the polymer segments (e.g., to crosslink the PS matrix 32′). As previously described, the polymers can be structured to inherently crosslink, or one or both of the polymer blocks of the copolymer material can be formulated to contain a crosslinking agent.

As shown in FIGS. 12 and 12A, a layer 34 a′ of a lamellar-phase block copolymer material (inherent pitch at or about L_(o)) is then deposited onto the annealed and crosslinked base film 28′ to a thickness (t₂) at or about the L_(o) value of the lamellar-phase block copolymer material. The lamellar-phase block copolymer material can be structured and formulated as previously described with respect to the embodiment of FIGS. 1-8. The volume fractions of the two blocks (AB) of a lamellar-forming diblock copolymer are generally at a ratio between about 50:50 and 60:40, an example being a PS-b-PMMA copolymer at a 50:50 weight ratio (M_(n) of about 51 kg/mol), with a generally small difference in interfacial energies of each block with air to produce surface-exposed lamellae.

Subsequent annealing of the material of lamellar-phase block copolymer layer 34 a′ results in a self-assembled film 36 a′ composed of a single layer of perpendicular-oriented lamellar-phase domains 38 a′, 40 a′ in a striped pattern, which are ordered and registered, respectively, to the polymer domains 30′, 32′ of the cylindrical-phase base layer 28′, as illustrated in FIGS. 13 and 13A, with each domain having a width (w₂) of about L_(o). The copolymer material of lamellar-phase block copolymer layer 34 a′ on the spacers 20′ may self-assemble but without registration or long-range order. The annealed film 36 a′ is then treated to crosslink the polymer segments (e.g., PS domains 40 a′), as previously described.

Referring now to FIG. 14, a second layer 34 b′ of a lamellar-phase block copolymer material can then be deposited onto the previously annealed and crosslinked film 36 a′ to a thickness (t₂) at or about L_(o). The second lamellar-phase block copolymer layer 34 b′ can then be annealed to form a second film layer 36 b′ composed of lamellar-phase domains 38 b′, 40 b′ oriented and registered to the underlying polymer blocks 38 a′, 40 a′, resulting in the structure shown in FIG. 15. The copolymer material 34 b′ over the copolymer layer 34 a′ on the spacers 20′ may self-assemble but without registration or long-range order. The film 36 b′ can then be crosslinked, and additional layers of the lamellar-phase block copolymer can be deposited, annealed and crosslinked to form a film structure 42′ of the desired thickness (T). The additional layers of the self-assembled and crosslinked film can be added to increase the aspect ratio of the openings subsequently formed in the multilayered film.

The non-ordered material of lamellar-phase block copolymer layers 34 a′, 34 b′ remaining on the spacers 20′ can then be removed resulting in the structure shown in FIG. 16. For example, a solvent wash can be applied to remove residual copolymer material from the spacers 20′ that has not been cross-linked (e.g., it was masked during crosslinking of the polymer layers). Photo-patterning and a selective O₂ plasma etch can be used to remove crosslinked polymer material from the spacers 20′.

Selective removal of one of the polymer blocks of the layers 36 a-36 b′ and the base film 28′ can then be performed to produce the thin film 44′ with openings/slits that expose the underlying substrate 10′ and can be used as an etch mask. In the removal of the lamellar domains 38 a-38 b′ and the half-cylinders domains 30′ (e.g., PMMA), the matrix 32′ (e.g., PS) situated underneath the half-cylinders 30′ and over the trench floor 18′ remains as shown by the intermediate structure 43′ in FIG. 17. That portion of matrix 32′ can be removed, for example, by a plasma O₂ or CF₄ etch, prior to a patterning process to expose the underlying substrate 10′, resulting in the film 44′ illustrated in FIGS. 18 and 18A.

The film can be used, for example, to pattern (arrows ↓↓) the underlying substrate 10′ to delineate a series of channels or grooves 50′, shown in phantom in FIG. 18A, to an active area or element 51 a′, which can then be filled with a material 51 b′, for example, a conductive metal or dielectric material, as depicted in FIG. 18B.

A method according to another embodiment of the invention for forming thin films of a cylindrical-phase self-assembling block copolymer that define an array of perpendicularly-oriented cylinders in a polymer matrix is illustrated with reference to FIGS. 19-25. The described embodiment utilizes topographical features, the sidewalls and ends of trenches, as constraints to induce orientation and registration of cylindrical copolymer domains to achieve a hexagonal array of perpendicularly-oriented cylinders within a polymer matrix registered to the trench sidewalls.

As described with reference to FIGS. 1 and 1A, a trench 16″ is etched in a material layer 14″ to expose a neutral wetting surface on an underlying substrate 10″. The width (w_(t)) of the trench 16″ is at or about nL_(o). The ends 24″ are angled to the sidewalls 22″ as shown, for example, at an about 60° angle, and in some embodiments are slightly rounded.

The trenches are also structured such that the trench floor 18″ is neutral wetting to both blocks of the copolymer material, and the sidewalls 22″ and ends 24″ are preferential wetting by the minority block of the copolymer. Entropic forces drive the wetting of a neutral-wetting surface by both blocks, resulting in a perpendicular orientation of the self-assembled cylinders. In the illustrated example, the material layer 14″ is composed of silicon oxide (SiO_(x)) and the substrate 10″ is composed of silicon. As previously described, a neutral wetting layer 12″ can be provided, for example, by applying a neutral wetting polymer on the surface of the substrate 10″ before forming the material layer 14″, and the trenches 16″ can be etched expose the neutral wetting layer 12″ forming the trench floors 18″. For example, in the use of a PS-b-PMMA diblock copolymer, a random copolymer brush layer (e.g., PS-r-PMMA, PS-r-PMMA-r-BCB, etc.) can be blanket deposited and grafted/crosslinked to the substrate 10″. Another neutral wetting surface for PS-b-PMMA can be provided by hydrogen-terminated silicon, or by PS-r-PMMA (˜60 mol % PS) graft polymerized in situ onto H-terminated silicon.

As previously described, sidewalls 22″ and ends 24″ that are preferential wetting toward the PMMA block of a PS-b-PMMA diblock copolymer can be provided by a material layer 14″ composed of silicon oxide (SiO_(x)), silicon nitride, silicon oxycarbide, a PMMA polymer modified with a moiety containing hydroxyl (—OH) group(s) (e.g., hydroxyethylmethacrylate) grafted to a sidewall material such as silicon oxide, and resist materials such as such as methacrylate based resists. Upon annealing, the PMMA block of the PS-b-PMMA copolymer layer will segregate to the sidewalls and ends of the trench to form a wetting layer (30 a″ in FIGS. 19 and 19A).

As illustrated in FIGS. 2 and 2A, a cylindrical-phase diblock copolymer material 26″ having an inherent pitch at or about L_(o) (or blend with homopolymers) is deposited onto the neutral wetting layer 12″ on the floor 18″ of the trench 16″ to a thickness (t₁) of less than or about equal to the L_(o) value of the copolymer material to up to about 1.5×L_(o), such that the copolymer film layer will self-assemble upon annealing to form a hexagonal array of perpendicular cylindrical domains having a diameter of about 0.5 L_(o) (e.g., about 20 nm) in the middle of a polymer matrix within each trench (e.g., with the adjacent cylindrical domains having a center-to-center distance of at or about L_(o) (e.g., about 35 nm). In embodiments in which the base or template layer is formed from a cylinder-forming diblock copolymer, the volume fractions of the two blocks (AB) are generally at a ratio between about 60:40 and 80:20. An example of a cylindrical-phase PS-b-PMMA copolymer material (L_(o)=35 nm) is composed of about 70% PS and 30% PMMA with a total molecular weight (M_(n)) of 67 kg/mol, to form about 20 nm diameter cylindrical PMMA domains in a matrix of PS.

Referring now to FIGS. 19 and 19A, the cylindrical-phase diblock copolymer film 26″ is then annealed, resulting in a base film 28″. The character of the cylindrical-phase diblock copolymer composition 26″ combined with a neutral wetting trench floor 18″ and preferential wetting sidewalls 22″ and ends 24″, and constraints provided by the width (w_(t)) of trench 16″ results, upon annealing, in a hexagonal array of perpendicularly-oriented cylindrical domains 30″ of the minor polymer block (i.e., like domains) (e.g., PMMA) within a matrix 32″ of the major polymer block (e.g., PS). A thin layer 30 a″ of the minor polymer block (e.g., PMMA) wets the sidewalls 18″. The hexagonal array contains n single rows of cylinders according to the width (w_(t)) of the trench with the cylinders 30″ in each row being offset by about L_(o) (pitch distance or center-to-center distance) from the cylinders in the adjacent rows. Each row contains a number of cylinders, generally m cylinders, which number can vary according to the length (l_(t)) of the trench and the shape of the trench end (e.g., rounded, angled, etc.) with some rows having greater or less than m cylinders. The pitch distance between each cylinder 30″ (within a row) is generally at or about L_(o).

The annealed cylindrical-phase base film 28″ is then treated to crosslink the polymer segments (e.g., to crosslink the PS matrix 32″). As previously described, the polymers can be structured to inherently crosslink, or one or both of the polymer blocks of the copolymer material can be formulated to contain a crosslinking agent. The polymer material remaining on the spacers 20″ can then be removed as previously described.

As shown in FIGS. 20 and 20A, a layer 34 a″ of a cylindrical-phase block copolymer material (inherent pitch at or about L_(o)) is then deposited onto the annealed and crosslinked base film 28″ to a thickness (t₂) at or about the L_(o) value of the cylindrical-phase block copolymer material 36 a″. Subsequent annealing of the material of cylindrical-phase block copolymer layer 34 a″ results in a film 36 a″ composed of a single layer of a hexagonal array of perpendicular-oriented cylindrical domains 38 a″ within a polymer matrix 40 a″ which are ordered and registered to the underlying cylindrical domains 30″ and matrix 32″ of the base layer 28″, as illustrated in FIGS. 21 and 21A, with the cylinders 38 a″ spaced apart and aligned with the cylinders 30″ of the base layer 28″, e.g., at a pitch distance (p) at or about L_(o)*cos(π/6) or 0.833 L_(o) distance between two parallel lines where one line bisects the cylinders in a given row and the other line bisects the cylinders in an adjacent row, and at a pitch distance (p) at or about L_(o) between cylinders in the same row and an adjacent row.

The annealed film 36 a″ is then treated to crosslink the polymer segments (e.g., PS matrix 40 a″) and the polymer material on the spacers 20″ removed, as previously described. A second layer 34 b″ of the cylindrical-phase block copolymer material can be deposited onto the annealed and crosslinked film 36 a″ to a thickness (t₂) at or about L_(o) (FIG. 22), and annealed to form a second film layer 36 b″ composed of perpendicular-oriented cylindrical domains 38 b″ in a matrix 40 b″ which are oriented and registered to the underlying cylinders 38 a″ and matrix 40 a″, as depicted in FIG. 23. The film 36 b″ is then crosslinked, and the polymer material on the spacers 20″ can be removed to produce the film structure 42″ as shown. Additional layers of the cylindrical-phase diblock copolymer can be deposited, annealed and crosslinked to form a film structure of a desired thickness (7) and to increase the aspect ratio of the openings formed in the multilayered film.

One of the block components can then be selectively removed from the film 42″, leaving either the matrix 48″ to produce a film 44 a″ composed of a hexagonal array of cylindrical openings 46″ as in FIGS. 24 and 24A, or the cylindrical domains 52″ to produce a film 44 b″ as in FIGS. 25 and 25A. After selective removal of one of the polymer domains, the resulting films 44 a″, 44 b″ can be used, for example, as a lithographic template or mask to pattern the underlying substrate 10″ in a semiconductor processing to define regular patterns in the nanometer size range (i.e., about 5-50 nm).

For example, referring to FIGS. 24 and 24A, selective removal of the minor block cylinders 30″, 38 a-38 b″ (e.g., PMMA) will result in a film 44 a″ composed of a hexagonal array of openings 46″ within the matrix 48″ of the major block (e.g., PS), the openings having a diameter of about 5-50 nm and an aspect ratio generally at least about 1:2 and ranging from about 1:2 to about 1:20. The film 44 a″ can be used as an etch mask to pattern (arrows ↓↓) the underlying substrate 10″ to form an array of openings 50″ in the substrate 10″ (shown in phantom in FIG. 24A) to an active area or element 51 a″. Further processing can then be performed as desired, for example, the removal of the residual matrix 48″ (e.g., PS) and filling of the openings 50″ in substrate 10″ with a material 51 b″, as shown in FIG. 24B, for example, with a metal or conductive alloy such as Cu, Al, W, Si, and Ti₃N₄, among others, to form contacts, for example, to an underlying active area or conductive line 51 a″, or with a metal-insulator-metal-stack to form capacitors with an insulating material such as SiO₂, Al₂O₃, HfO₂, ZrO₂, SrTiO₃, among other dielectrics.

In another embodiment illustrated in FIGS. 25 and 25A, the selective removal of the major block matrix 32″/40 a-40 b″ (e.g., PMMA) will provide a film 44 b″ composed of a hexagonal array of minor block cylinders 52″ (e.g., PS). Such an embodiment would require a majority PMMA block copolymer and sidewalls composed of a material that is selectively PS-wetting (e.g., a gold sidewall or PS-grafted to the sidewall material). The film 44 b″ composed of cylinders 52″ can be used as an etch mask (arrows 11) to etch a patterned opening 54″ in the underlying substrate 10″ (shown in phantom in FIG. 25A) with the substrate 10″ etched to form cylinders masked by the cylindrical elements 52″ of the film 44 b″. Further processing can then be conducted, for example, the removal of the residual cylinders 52″ of the polymer mask 44 b″ and the deposition of a material 51 b″ distinct from substrate 10″ into the opening 54″ to provide a differential surface, as illustrated in FIG. 25B. For example, openings 54″ in a silicon substrate 10″ can be filled with a dielectric material such as SiO₂, with the cylinders of the residual substrate 10″ (e.g., of silicon) providing contacts to an underlying active area or metal lines 51 a″.

In an embodiment of a method to produce a one-dimensional (1-D) array of perpendicularly-oriented cylinders as illustrated in FIGS. 26-32, the foregoing process for forming a hexagonal array of cylinders with a cylindrical-phase block copolymer can be modified by utilizing the trench sidewalls and ends as constraints to induce orientation and registration of cylindrical copolymer domains in a single row parallel to the trench sidewalls.

In embodiments to provide a single row of cylinders within a polymer matrix, a trench 16′″ is structured to have a width (w_(t)) that is at or about the L_(o) value of the block copolymer material, a floor 18′″ that is neutral wetting to both blocks of the copolymer material, and sidewalls 22′″ and ends 24′″ that are preferential wetting by the minority block of the copolymer. In the illustrated example, the material layer 14′″ (e.g., SiO_(x), SiN, etc.) exposed on the sidewalls 22′″ and ends 24′″ is preferential wetting toward the PMMA block of a PS-b-PMMA diblock copolymer, and the substrate 10′″ (e.g., silicon) bears a neutral wetting layer 12′″ (e.g., a neutral wetting polymer, H-terminated silicon) which is exposed at the trench floors 18′″.

A cylindrical-phase diblock copolymer material film 26′″ having an inherent pitch at or about L_(o) (or blend with homopolymers) can be deposited onto the neutral wetting layer 12′″ on the trench floor 18′ to a thickness (t₁) of less than or about equal to the L_(o) value of the copolymer material to up to about 1.5×L_(o) (as shown in FIGS. 2 and 2A). The cylindrical-phase diblock copolymer material film 26′″ is then annealed, whereupon the copolymer film layer will self-assemble to form a base film 28′, as illustrated in FIGS. 26 and 26A. The constraints provided by the width (w_(t)) of trench 16′″ and the character of the cylindrical-phase diblock copolymer material film 26″ combined with a neutral wetting trench floor 18′ and preferential wetting sidewalls 22′ and ends 24′″ results in a one-dimensional (1-D) array or single row of perpendicularly-oriented cylindrical domains 30′″ of the minority polymer block (e.g., PMMA) within a matrix 32′″ of the major polymer block (e.g., PS), with the minority block segregating to the sidewalls 18′″ of the trench to form a wetting layer 30 a″. In some embodiments, the cylinders have a diameter at or about 0.5 L_(o) (e.g., about 20 nm), the number n of cylinders in the row is according to the length of the trench, and the center-to-center distance (pitch distance) (p) between each like domain (cylinder) is at or about L_(o) (e.g., about 35 nm). The annealed cylindrical-phase base film 28′ is then treated to crosslink the polymer segments (e.g., the PS matrix 32″).

Processing can then be continued to form a cylindrical-phase block copolymer layer 36 a′″ on the base film (FIG. 27), which upon annealing results in a single layer of perpendicular cylindrical domains 38 a′″ within a polymer matrix 40 a″, which are ordered and registered to the underlying cylindrical domains 30′″ and matrix 32′″ of the base layer 28′″ (FIG. 28). The film 36 a′″ is then treated to crosslink the polymer segments (e.g., PS matrix 40 a.′″) as previously described. A second layer 34 b′″ of the cylindrical-phase block copolymer can then be deposited onto the annealed/crosslinked film 36 a′″ to a thickness (t₂) at or about L_(o) (FIG. 29) and annealed. The resulting film 36 b′″ (FIG. 30) is composed of perpendicular-oriented cylindrical domains 381 f in a matrix 40 b′″ oriented and registered to the underlying cylinders 38 a′″ and matrix 40 a′″ of film 36 a′″. The film 36 b′″ is crosslinked, and non-ordered polymer material on the spacers 20′″ can be removed to produce the film structure 42′. Additional layers of the cylindrical-phase diblock copolymer can be deposited, annealed and crosslinked to form a film structure of a desired thickness (T).

Selective removal of one of the block components can then be performed resulting in a film 44 a′″ composed of the matrix 48′″ with a 1-D array of cylindrical openings 46′″ as in FIGS. 31 and 31A. In another embodiment, selective removal of the matrix components 32″/40 a-40 b′″ produces a film 44 b′″ composed of a 1-D array of cylinders 52′″ as in FIGS. 32 and 32A. The film can be used as a mask to etch the underlying substrate 10′″.

For example, referring to FIGS. 31 and 31A, selective removal of the minor block cylinders 30′″, 38 a-38 b′″ (e.g., PMMA) will result in a film 44A′″ composed of a 1-D array of openings 46′″ within the matrix 48′″ of the major block (e.g., PS), the openings having a diameter of about 5-50 nm and an aspect ratio of about 1:2 to about 1:20. The film 44A′″ can be used as an etch mask to pattern (arrows ↓↓) the underlying substrate 10′″ to form an array of openings 50′″ (shown in phantom in FIG. 31A) extending to an active area or element 51 a′″. The residual film 44A′″ can then be removed and the openings 50′″ in the substrate 10′″ can be filled as shown in FIG. 31B with a material 51 b′″, for example, a metal or conductive alloy to provide a 1-D array of contacts to an underlying active area or line contact 51 a′″, for example, or with metal-insulator-metal-stacks to form capacitors. Further processing can then be performed as desired.

In another embodiment depicted in FIGS. 32 and 32A, the selective removal of the major block matrix components 32′″, 40 a-40 b′″ (e.g., PMMA) will provide a film 44 b′″ composed of a 1-D array of the minor block cylinders 52′″ (e.g., PS). The film 44 b′″ can be used as a mask or template in an etch process (arrows ↓↓) to form a patterned opening 54′″ (shown in phantom in FIG. 32A) in the underlying substrate 10′″, with the masked substrate 10′″ etched to form cylinders. The residual cylinders 52′″ of the polymer mask 44 b′″ can then be removed and a material 51 b′″ such as a dielectric material (e.g., oxide) that is distinct from the substrate 10′″ (e.g., silicon) can be deposited to fill the opening 54″ as shown in FIG. 32B, to provide a differential surface to the substrate 10″ cylinders, which can provide contacts to an underlying active area or metal line 51 a′″, for example.

Although specific embodiments have been illustrated and described herein, it will be appreciated by those of ordinary skill in the art that any arrangement which is calculated to achieve the same purpose may be substituted for the specific embodiments shown. This application is intended to cover any adaptations or variations that operate according to the principles of the invention as described. Therefore, it is intended that this invention be limited only by the claims and the equivalents thereof. The disclosures of patents, references and publications cited in the application are incorporated by reference herein. 

What is claimed is:
 1. A self-assembled block copolymer structure, comprising: a first self-assembled block copolymer material within a trench in a substrate, the first self-assembled block copolymer material having a thickness greater than a depth of the trench, the first self-assembled block copolymer material comprising half-cylindrical domains parallel to sidewalls and extending a length of the trench; and a second self-assembled block copolymer material overlying the first self-assembled block copolymer material and above the trench, the second self-assembled block copolymer material comprising a different material than the first self-assembled block copolymer material, the second self-assembled block copolymer material comprising lamellar domains perpendicular to a floor of the trench, the lamellar domains of the second self-assembled block copolymer material registered to the half-cylindrical domains of the first self-assembled block copolymer material.
 2. The self-assembled block copolymer structure of claim 1, wherein the sidewalls are preferentially wetting sidewalls.
 3. The self-assembled block copolymer structure of claim 1, wherein the half-cylindrical domains of the base block copolymer material are in a single row within the trench.
 4. A self-assembled block copolymer structure within a trench in a substrate, the self-assembled block copolymer structure comprising: alternating lamellar domains of a first polymer block and a second polymer block of a first block copolymer material, the alternating lamellar domains perpendicular to a floor of the trench at a pitch distance of about L_(o) across a width and extending a length of the trench in a substantially parallel orientation to sidewalls of the trench, the alternating lamellar domains of the first block copolymer material registered to underlying half-cylinders in a polymer matrix of a second block copolymer material, the half-cylinders extending the length of the trench and oriented parallel to the sidewalls and floor of the trench, wherein the first block copolymer material comprises a different material than the second block copolymer material, and the self-assembled block copolymer structure comprises a thickness of at least about 2L_(o) of the second block copolymer material.
 5. A multi-layered self-assembled block copolymer structure, comprising: alternating lamellar domains of a first polymer block and a second polymer block of a lamellar-phase block copolymer material, the alternating lamellar domains above a trench and perpendicular to a floor of the trench; and half-cylinder domains in a polymer matrix of a base block copolymer, the base block copolymer comprising a different material than the lamellar-phase block copolymer material, the half-cylinder domains underlying the alternating lamellar domains, the underlying half-cylinders within the trench and parallel to the floor and sidewalls of the trench, the alternating lamellar domains at a pitch distance of about L_(o) of the base block copolymer material.
 6. A template, comprising a self-assembled block copolymer structure within a trench, the self-assembled block copolymer structure comprising a plurality of lines spanning a width of the trench, the plurality of lines extending a length of the trench and separated by openings exposing a floor of the trench, the plurality of lines having a greater height than a depth of the trench, the self-assembled block copolymer structure comprising a cylindrical-phase base block copolymer material and a lamellar-phase block copolymer material overlying the cylindrical-phase base block copolymer material, the lamellar-phase block copolymer material comprising a different material than the cylindrical-phase base block copolymer material, the cylindrical-phase base block copolymer material comprising half-cylindrical polymer domains parallel to sidewalls and the floor of the trench, the lamellar-phase block copolymer material comprising lamellar polymer domains perpendicular to the floor of the trench and registered to the half-cylindrical polymer domains of the cylindrical-phase base block copolymer material.
 7. The template of claim 6, wherein the plurality of lines are separated by the openings exposing the floor of the trench, the openings comprising a width of from about 5 nm to 50 nm. 